TSMC launches multi-layer mask service
EDN
Aimed at prototyping single- or multi-chip verifications or small volume production runs, the Hsinchu, Taiwan-based wafer foundry has launched what it says is the industry’s first multi-layer mask service for 90-, 80- and 65-nm semiconductor manufacturing process technologies.
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Credence expands Diamond platform to offer multi-site mixed-signal test
Test & Measurement
Credence Systems has introduced the MultiWave mixed-signal instrument for multi-site testing of highly integrated system-in-package (SIP) and system-on-chip (SOC) devices used in mainstream consumer applications.
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Pickering's LXI video multiplexer packs 72 channels
Test & Measurement
Pickering Interfaces has expanded its range of LXI switching products with the introduction of a 72-channel video multiplexer intended for switching RF signals in 75-ohm systems at frequencies of up to 1 GHz.
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